2013년 2월 해외 석학 초청 세미나 (Dr. Voldman)

Electrostatic Discharge (ESD) in the Nano-electronic Era by Dr. Voldman Abstract: Electrostatic Discharge (ESD) phenomenon today is a reliability concern in semiconductor components, systems from cell phones, laptops, to automotive products. A key question today in the semiconductor industry is whether ESD sensitivity will be a roadblock to the introduction, manufacturability or implementation of today’s […]

윤대근 박사 논문 TTST 게재

본 연구실 윤대근 박사가 TTST에 제출한 논문이 게재 되었습니다. 축하합니다. 서지 정보 및 링크는 다음과 같습니다. Daekeun Yoon, Jongwon Yun, and Jae-Sung Rieh, “A 310 – 340 GHz Coupled-Line Voltage-Controlled Oscillator Based on 0.25-um InP HBT Technology,” IEEE Transactions of Terahertz Science and Technology, vol. 5, No. 4, pp. 652-654, July 2015. http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7137691&newsearch=true&queryText=A%20310%20%E2%80%93%20340%20GHz%20Coupled-Line%20Voltage-Controlled%20Oscillator%20Based%20on%200.25-um%20InP%20HBT%20Technology